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- Kwon, Soon-Yong
- Frontier, Innovative Nanomaterials & Devices Lab.
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In-situ, real time thickness monitoring of GaN growth by spectral refelectance
- Author(s)
- Kwon, Soon-Yong
- Issued Date
- 2000-01-01
- Citation
- The 7th Korean Conference on Semiconductors
- Publisher
- 한국반도체협회
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