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- Yoon, Tae-Sik
- Nano Semiconductor Research Lab.
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Surface Roughness and Dislocation Distribution in Compositionally Graded Relaxed SiGe Buffer Layer with Inserted Strained Si Layers
- Author(s)
- Yoon, Tae-Sik
- Issued Date
- 2005-03-22
- Citation
- American Physical Society March Meeting 2005
- Publisher
- American Physical Society
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