dc.citation.conferencePlace |
US |
- |
dc.citation.conferencePlace |
Los Angeles, CA, USA |
- |
dc.citation.title |
American Physical Society March Meeting 2005 |
- |
dc.contributor.author |
Yoon, Tae-Sik |
- |
dc.date.accessioned |
2023-12-20T05:37:07Z |
- |
dc.date.available |
2023-12-20T05:37:07Z |
- |
dc.date.created |
2021-03-23 |
- |
dc.date.issued |
2005-03-22 |
- |
dc.identifier.bibliographicCitation |
American Physical Society March Meeting 2005 |
- |
dc.identifier.uri |
https://scholarworks.unist.ac.kr/handle/201301/50712 |
- |
dc.publisher |
American Physical Society |
- |
dc.title |
Surface Roughness and Dislocation Distribution in Compositionally Graded Relaxed SiGe Buffer Layer with Inserted Strained Si Layers |
- |
dc.type |
Conference Paper |
- |
dc.date.conferenceDate |
2005-03-21 |
- |