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- Yoon, Tae-Sik
- Nano Semiconductor Research Lab.
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Memory Characteristics of Indium Gallium Zinc Oxide Thin Film Transistors with Double Gates and Pt-Fe2O3 Core-Shell Nanoparticles Storage Nodes
- Author(s)
- Yoon, Tae-Sik
- Issued Date
- 2014-04-23
- Citation
- 2014 MRS Spring Meeting
- Publisher
- Materials Research Society
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