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윤태식

Yoon, Tae-Sik
Nano Semiconductor Research Lab.
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Memcapacitive Characteristis of Metal-Oxide-Semiconductor Capacitor Structures by Compositional Redistribution

Author(s)
Yoon, Tae-Sik
Issued Date
2016-05-31
URI
https://scholarworks.unist.ac.kr/handle/201301/50615
Citation
229th ECS Meeting
Publisher
Electrochemical Society

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