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Yoon, Tae-Sik
Nano Semiconductor Research Lab.
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Analog Memcapacitance Characteristics in Al/SiO2/TaOx/n-IGZO Capacitor Structure for Synaptic Transistor

Author(s)
Beom, Geon WonYang, PaulPark, DaehoonKim, Hyung JunKang, Chi JungYoon, Tae-Sik
Issued Date
2018-04-03
URI
https://scholarworks.unist.ac.kr/handle/201301/50606
Citation
2018 MRS Spring Meeting & Exhibit
Publisher
Materials Research Society

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