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Jeong, Hongsik
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Heterogeneously structured phase-change materials and memory

Author(s)
Yang, WonjunHur, NamwookLim, Dong-HyeokJeong, HongsikSuh, Joonki
Issued Date
2021-02
DOI
10.1063/5.0031947
URI
https://scholarworks.unist.ac.kr/handle/201301/50577
Fulltext
https://aip.scitation.org/doi/10.1063/5.0031947
Citation
JOURNAL OF APPLIED PHYSICS, v.129, no.5, pp.050903
Abstract
Phase-change memory (PCM), a non-volatile memory technology, is considered the most promising candidate for storage class memory and neuro-inspired devices. It is generally fabricated based on GeTe-Sb2Te3 pseudo-binary alloys. However, natively, it has technical limitations, such as noise and drift in electrical resistance and high current in operation for real-world device applications. Recently, heterogeneously structured PCMs (HET-PCMs), where phase-change materials are hetero-assembled with functional (barrier) materials in a memory cell, have shown a dramatic enhancement in device performance by reducing such inherent limitations. In this Perspective, we introduce recent developments in HET-PCMs and relevant mechanisms of operation in comparison with those of conventional alloy-type PCMs. We also highlight corresponding device enhancements, particularly their thermal stability, endurance, RESET current density, SET speed, and resistance drift. Last, we provide an outlook on promising research directions for HET-PCMs including PCM-based neuromorphic computing.
Publisher
AMER INST PHYSICS
ISSN
0021-8979
Keyword
ATOMIC LAYER DEPOSITIONHIGH-THERMAL-STABILITYRESISTANCE DRIFTHIGH-DENSITYTHIN-FILMSHIGH-SPEEDCRYSTALLIZATIONNONVOLATILEGE2SB2TE5CELL

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