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Yoon, Tae-Sik
Nano Semiconductor Research Lab.
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Digital versus analog resistive switching depending on the thickness of nickel oxide nanoparticle assembly

Author(s)
Kim, Hyung JunBaek, Yoon-JaeChoi, Young JinKang, Chi JungLee, Hyun HoKim, Hyun-MiKim, Ki-BumYoon, Tae-Sik
Issued Date
2013-10
DOI
10.1039/c3ra42683a
URI
https://scholarworks.unist.ac.kr/handle/201301/50246
Citation
RSC ADVANCES, v.3, no.43, pp.20978 - 20983
Abstract
The thickness-dependent digital versus analog resistive switching of nickel oxide (NiOx) nanoparticle assemblies was investigated in a Ti/NiOx/Pt structure. The NiiO(x) nanoparticles were chemically synthesized with similar to 5 nm diameter. The Ti/NiiO(x)/Pt structure with assembly thickness of similar to 60 nm exhibited the digital-type bipolar resistive switching. However, the assembly with a thickness of similar to 90 nm presented analog resistive switching with gradually decreasing resistance when sweeping -V while increasing resistance after applying +V. Repeating -V pulses decreased the resistance sequentially, but the high resistance was restored sequentially by repeating +V pulses, which is analogous to the potentiation and depression of adaptive synaptic motion.
Publisher
ROYAL SOC CHEMISTRY
ISSN
2046-2069
Keyword
CHARGE-LIMITED CURRENTSNIOMEMORIESSYSTEMSDEVICEFILMS

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