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- Lee, Zonghoon
- Atomic-Scale Electron Microscopy Lab.
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| DC Field | Value | Language |
|---|---|---|
| dc.citation.endPage | 4472 | - |
| dc.citation.number | 40 | - |
| dc.citation.startPage | 4467 | - |
| dc.citation.title | ADVANCED MATERIALS | - |
| dc.citation.volume | 22 | - |
| dc.contributor.author | Erickson, Kris | - |
| dc.contributor.author | Erni, Rolf | - |
| dc.contributor.author | Lee, Zonghoon | - |
| dc.contributor.author | Alem, Nasim | - |
| dc.contributor.author | Gannett, Will | - |
| dc.contributor.author | Zettl, Alex | - |
| dc.date.accessioned | 2023-12-22T06:42:45Z | - |
| dc.date.available | 2023-12-22T06:42:45Z | - |
| dc.date.created | 2014-06-23 | - |
| dc.date.issued | 2010-10 | - |
| dc.description.abstract | The local atomic structure of graphene oxide (GO) and reduced annealed graphene oxide (raGO) is determined via ultra-high-resolution transmission electron microscopy. We find that the proposed and desired return to graphene from GO is not possible through the synthetic route employed. The detailed structure of GO, previously unknown, is revealed as mottled, with few square nanometer graphitic regions separated by highly oxidized regions. | - |
| dc.identifier.bibliographicCitation | ADVANCED MATERIALS, v.22, no.40, pp.4467 - 4472 | - |
| dc.identifier.doi | 10.1002/adma.201000732 | - |
| dc.identifier.issn | 0935-9648 | - |
| dc.identifier.scopusid | 2-s2.0-78149448625 | - |
| dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/5017 | - |
| dc.identifier.url | http://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=78149448625 | - |
| dc.identifier.wosid | 000284000900006 | - |
| dc.language | 영어 | - |
| dc.publisher | WILEY-V C H VERLAG GMBH | - |
| dc.title | Determination of the Local Chemical Structure of Graphene Oxide and Reduced Graphene Oxide | - |
| dc.type | Article | - |
| dc.description.journalRegisteredClass | scie | - |
| dc.description.journalRegisteredClass | scopus | - |
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