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Lee, Zonghoon
Atomic-Scale Electron Microscopy (ASEM) Lab
Research Interests
  • Advanced Transmission Electron Microscopy (TEM/STEM), in Situ TEM, graphene, 2D materials, low-dimensional crystals, nanostructured materials

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Active Pixel Sensors for electron microscopy

Cited 15 times inthomson ciCited 13 times inthomson ci
Title
Active Pixel Sensors for electron microscopy
Author
Denes, P.Bussat, J.-M.Lee, ZonghoonRadmillovic, V.
Keywords
Active Pixel Sensor; Electron microscopy
Issue Date
2007-09
Publisher
ELSEVIER SCIENCE BV
Citation
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, v.579, no.2, pp.891 - 894
Abstract
The technology used for monolithic CMOS imagers, popular for cell phone cameras and other photographic applications, has been explored for charged particle tracking by the high-energy physics community for several years. This technology also lends itself to certain imaging detector applications in electron microscopy. We have been developing such detectors for several years at Lawrence Berkeley National Laboratory, and we and others have shown that this technology can offer excellent point-spread function, direct detection and high readout speed. In this paper, we describe some of the design constraints peculiar to electron microscopy and summarize where such detectors could play a useful role.
URI
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DOI
10.1016/j.nima.2007.05.308
ISSN
0168-9002
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MSE_Journal Papers
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