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Jeong, Hu Young
UNIST Central Research Facilities (UCRF)
Research Interests
  • Soft material characterization such as graphene using a low kV Cs-corrected TEM
  • Insitu-TEM characterization of carbon-based materials using nanofactory STM holder for Li-ion battery application
  • Structural characterization of mesoporous materials using SEM & TEM
  • Interface analysis between various oxides and metals through Cs-corrected (S)TEM
  • Resistive switching mechanism of graphene oxide thin films for RRAM application

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Recent progress in scanning electron microscopy for the characterization of fine structural details of nano materials

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Title
Recent progress in scanning electron microscopy for the characterization of fine structural details of nano materials
Author
Suga, MitsuoAsahina, ShunsukeSakuda, YusukeKazumori, HiroyoshiNishiyama, HidetoshiNokuo, TakeshiAlfredsson, VivekaKjellman, TomasStevens, Sam M.Cho, Hae SungCho, MinhyungHan, LuChe, ShunaiAnderson, Michael W.Schueth, FerdiDeng, HexiangYaghi, Omar M.Liu, ZhengJeong, Hu YoungStein, AndreasSakamoto, KazuyukiRyoo, RyongTerasaki, Osamu
Issue Date
2014-05
Publisher
PERGAMON-ELSEVIER SCIENCE LTD
Citation
PROGRESS IN SOLID STATE CHEMISTRY, v.42, no.1-2, pp.1 - 21
Abstract
Research concerning nano-materials (metal-organic frameworks (MOFs), zeolites, mesoporous silicas, etc.) and the nano-scale, including potential barriers for the particulates to diffusion to/from is of increasing importance to the understanding of the catalytic utility of porous materials when combined with any potential super structures (such as hierarchically porous materials). However, it is difficult to characterize the structure of for example MOFs via X-ray powder diffraction because of the serious overlapping of reflections caused by their large unit cells, and it is also difficult to directly observe the opening of surface pores using ordinary methods. Electron-microscopic methods including high-resolution scanning electron microscopy (HRSEM) have therefore become imperative for the above challenges. Here, we present the theory and practical application of recent advances such as through-the-lens detection systems, which permit a reduced landing energy and the selection of high-resolution, topographically specific emitted electrons, even from electrically insulating nano-materials.
URI
https://scholarworks.unist.ac.kr/handle/201301/4921
URL
http://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=84898043548
DOI
10.1016/j.progsolidstchem.2014.02.001
ISSN
0079-6786
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UCRF_Journal Papers
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