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Resonance Raman spectroscopy in twisted bilayer graphene

Author(s)
Righi, A.Venezuela, R.Chacham, H.Costa, S. D.Fantini, C.Ruoff, R. S.Colombo, L.Bacsa, W. S.Pimenta, M. A.
Issued Date
2013-12
DOI
10.1016/j.ssc.2013.05.015
URI
https://scholarworks.unist.ac.kr/handle/201301/47498
Fulltext
https://www.sciencedirect.com/science/article/pii/S0038109813002548?via%3Dihub
Citation
SOLID STATE COMMUNICATIONS, v.175, pp.13 - 17
Abstract
In this work we study the Raman spectra of twisted bilayer graphene samples, with different twisting angles, by changing the incident laser energy between 2.54 and 4.14 eV. The spectra exhibit a number of extra peaks, classified in different families, each one associated with bilayer graphenes with different twisting rotational angles. We theoretically analyze the laser energy dependence of these extra peaks considering a set of discrete wavevectors within the interior of the Brillouin zone of graphene, which activate special double-resonance Raman processes. Our result show a nice qualitative agreement between the experimental and simulated spectra, demonstrating that these extra peaks are indeed ascribed to an umklapp double-resonance process in graphene systems.
Publisher
PERGAMON-ELSEVIER SCIENCE LTD
ISSN
0038-1098
Keyword (Author)
Twisted bilayer grapheneUmklapp double-resonanceResonance Raman scattering

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