File Download
There are no files associated with this item.
SFX Link
- Find it @ UNIST can give you direct access to the published full text of this article. (UNISTARs only)
- Lee, Zonghoon
- Atomic-Scale Electron Microscopy Lab.
Views & Downloads
Detailed Information
Cited time in 
Cited time in 
Cited time in
Metadata Downloads
Graphene Research at Atomic Scale using Aberration-corrected TEM
- Author(s)
- Lee, Zonghoon
- Issued Date
- 2014-06-24
- Citation
- 2014 Collaborative Conference on Materials Research (invited talk)
- Publisher
- Collaborative Conference on 3D Research
Items in Repository are protected by copyright, with all rights reserved, unless otherwise indicated.