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- Lee, Zonghoon
- Atomic-Scale Electron Microscopy Lab.
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Graphene Research at Atomic Scale using Aberration-corrected TEM
- Author(s)
- Lee, Zonghoon
- Issued Date
- 2014-12-10
- Citation
- 17th International Symposium on the Physics of Semiconductors and Applications (ISPSA-2014) (invited talk)
- Publisher
- 한국물리학회
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