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- Lee, Zonghoon
- Atomic-Scale Electron Microscopy Lab.
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Graphene Research at Atomic Scale using Low kV Aberration-Corrected TEM
- Author(s)
- Lee, Zonghoon
- Issued Date
- 2012
- Citation
- The 2nd KIST-UNIST International Symposium on Advanced Materials for Energy & Environmental Applications
- Publisher
- KIST & UNIST
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