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- Lee, Zonghoon
- Atomic-Scale Electron Microscopy Lab.
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Direct Mapping of Stacking Structure in Rotated Bilayer Graphene Using Aberration-corrected Transmission Electron Microscopy
- Author(s)
- Lee, Zonghoon, None
- Issued Date
- 2013
- Citation
- Microscopy & Microanalysis 2013
- Publisher
- Microscopy Society of America
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