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- Lee, Zonghoon
- Atomic-Scale Electron Microscopy Lab.
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The hide-and-seek of grain boundaries from moire pattern fringe of two-dimensional graphene
- Author(s)
- Lee, Zonghoon, Kim, Jung Hwa, Lee, Sukwoo
- Issued Date
- 2015-03-27
- Citation
- 그래핀 연구회 2회 심포지움
- Publisher
- 한국그래핀연구회
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