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- Lee, Zonghoon
- Atomic-Scale Electron Microscopy Lab.
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Research Progress on 2D Materials at Atomic Scale using Aberration Corrected Transmission Electron Microscopy
- Author(s)
- Lee, Zonghoon
- Issued Date
- 2015-10-09
- Citation
- Univ of Texas, Dallas 초청강연
- Publisher
- Univ of Texas, Dallas
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