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Kwon, Min-Suk
Ubiquitous Photonics Lab.
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Investigation and Improvement of 90 degrees Direct Bends of Metal-Insulator-Silicon-Insulator-Metal Waveguides

Author(s)
Shin, Jin-SooKwon, Min-SukLee, Chang-HeeShin, Sang-Yung
Issued Date
2013-10
DOI
10.1109/JPHOT.2013.2281983
URI
https://scholarworks.unist.ac.kr/handle/201301/4123
Fulltext
http://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=84885610297
Citation
IEEE PHOTONICS JOURNAL, v.5, no.5, pp.1 - 9
Abstract
We investigate 90\circ direct bends of metal-insulator-silicon- insulator-metal (MISIM) waveguides, which are hybrid plasmonic waveguides with replaceable insulators. First, we fabricate them using fully standard CMOS technology and characterize them. The experimental excess loss of the two consecutive 90circ direct bends is 11, 7.4, and 4.5 dB when the width of the Si line of the MISIM waveguide is about 160, 190, and 220 nm, respectively. Second, we analyze the experimental results using the 3-D finite-difference time-domain method. Through the analysis, we investigate possible loss mechanisms of the 90 circ direct bend, which have not been studied to our knowledge. It has been found that the Si lines should be narrow to reduce the excess losses of the 90 circ direct bends. However, the wide Si lines are better for ease of fabrication and for small propagation losses. Finally, we demonstrate a modified low-loss 90 circ direct bend of the MISIM waveguide with a wide Si line.
Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
ISSN
1943-0655
Keyword (Author)
Plasmonicssilicon nanophotonicssubwavelength structurewaveguides

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