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Noh, Sam H.
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The Effect of Absorbing Hot Write References on FTLs for Flash Storage Supporting High Data Integrity

Author(s)
Noh, Sam H.
Issued Date
2008-10-24
URI
https://scholarworks.unist.ac.kr/handle/201301/41076
Citation
International Workshop Software Support for Portable Storage (IWSSPS) 2008
Publisher
ACM

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