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- Noh, Sam H.
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Selective Process Persistence: A New Memory Technology Supported Mechanism for Highly Dependable Systems
- Author(s)
- Kim, Hyojeen, Noh, Sam H.
- Issued Date
- 2009-06
- Citation
- The 39th Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN 2009)
- Publisher
- IEEE
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