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최은미

Choi, EunMi
THz Vacuum Electronics and Applied Electromagnetics Lab.
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The measurement of minority carrier life time in a semi-conductor using quasi-optical millimeter and THz wave systems

Author(s)
Choe, Mun SeokChoi, EunMi
Issued Date
2016-12-16
URI
https://scholarworks.unist.ac.kr/handle/201301/40417
Fulltext
http://psl.postech.ac.kr/kjw16/
Citation
Korea-Japan Workshop on Physics and Technology of Heating and Current Drive
Publisher
Pohang Accelerator Laboratory (PAL)

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