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Lee, Zonghoon
Atomic-Scale Electron Microscopy Lab.
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Study on Grain Boundaries in Single-layer Graphene by Ultrahigh Resolution TEM

Author(s)
Lee, Zonghoon
Issued Date
2012
URI
https://scholarworks.unist.ac.kr/handle/201301/39204
Citation
한국진공학회 하계학술대회 (invited talk)
Publisher
한국진공학회

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