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- Lee, Zonghoon
- Atomic-Scale Electron Microscopy Lab.
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Investigation on Grain Boundaries in Single-layer Graphene by Aberration-corrected TEM
- Author(s)
- Lee, Zonghoon
- Issued Date
- 2012
- Citation
- 대한금속재료학회 2012 춘계학술대회 (젊은 과학자 초청강연) (invited talk)
- Publisher
- 대한금속재료학회
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