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- Lee, Zonghoon
- Atomic-Scale Electron Microscopy Lab.
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Investigation of stacking structure and defects of bilayer graphene using aberration-corrected TEM
- Author(s)
- Lee, Zonghoon
- Issued Date
- 2013-11-18
- Citation
- The 1st International conference on surface engineering (ICSE2013) (invited talk)
- Publisher
- The Korean Institute of surface engineering
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