File Download
There are no files associated with this item.
SFX Link
- Find it @ UNIST can give you direct access to the published full text of this article. (UNISTARs only)
- Lee, Zonghoon
- Atomic-Scale Electron Microscopy Lab.
Views & Downloads
Detailed Information
Cited time in 
Cited time in 
Cited time in
Metadata Downloads
Investigation of atomic-scale defects in 2-dimensional materials
- Author(s)
- Ryu, Gyeong Hee, Lee, Zonghoon
- Issued Date
- 2017-11-08
- Citation
- The 3rd East-Asia Microscopy Conference
- Publisher
- 한국현미경학회
Items in Repository are protected by copyright, with all rights reserved, unless otherwise indicated.