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- Lee, Zonghoon
- Atomic-Scale Electron Microscopy Lab.
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Facile Observation of Intrinsic Graphene Defects of Different Origins through Selective Oxygen Transport
- Author(s)
- Jo, Yongsu, Kwak, Jinsung, Park, Soon-Dong, Kim, Na Yeon, Kim, Se-Yang, Lee, Zonghoon, Kim, Sung Youb, Kwon, Soon-Yong
- Issued Date
- 2017-02-14
- Citation
- 제24회 한국반도체학술대회
- Publisher
- 한국반도체산업협회 외
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