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- Kim, Jingook
- Integrated Circuit and Electromagnetic Compatibility Lab.
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간접 접촉 프로빙 기법을 이용한 수직 인터컨넥트 배열의 전기적 특성추출
- Author(s)
- Han, Ki Jin, Kim, Jingook, Kang, Nowon, Jeong, Jongwoo
- Issued Date
- 2014-08-21
- Citation
- 2014 한국전자파학회 하계종합학술대회, pp.82
- Publisher
- 한국전자파학회
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