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Kim, Kyung Rok
Nano-Electronic Emerging Devices Lab.
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Non-Quasi-Static Modeling of Silicon Nanowire Metal-Oxide-Semiconductor Field-Effect Transistor and Its Model Verification up to 1 THz

Author(s)
Cho, SeongjaeKim, Kyung RokPark, Byung-GookKang, In Man
Issued Date
2010-11
DOI
10.1143/JJAP.49.110206
URI
https://scholarworks.unist.ac.kr/handle/201301/3545
Fulltext
http://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=79551644937
Citation
JAPANESE JOURNAL OF APPLIED PHYSICS, v.49, no.11, pp.1 - 3
Abstract
In this work the radio-frequency (RF) performances of a silicon nanowire (SNW) metal-oxide-semiconductor field effect transistor (MOSFET) were modeled by being grafted into the non-quasi-static (NQS) small-signal equivalent circuit for the first time. The parameters were analytically extracted from three-dimensional (3D) device simulations. The cutoff frequencies of an SNW MOSFET with a 30nm channel length and a 5 nm radius were 504 and 545 GHz in the linear and saturation regions, respectively The reliability of modeling results was verified by the simulations including realistic models It was confirmed that the SNW MOSFET would be the promising candidate as a core component for RF systems aiming 1 THz operation.
Publisher
IOP PUBLISHING LTD
ISSN
0021-4922

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