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최은미

Choi, EunMi
THz Vacuum Electronics and Applied Electromagnetics Lab.
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The study of millimeter-wave based quasi-optical photoconductivity decay technique for precise measurement of minority carrier life time

Author(s)
Choe, Mun SeokSawant, AshwiniLee, Kyu-SupYu, Nan EiChoi, EunMi
Issued Date
2016-09-25
DOI
10.1109/IRMMW-THz.2016.7758789
URI
https://scholarworks.unist.ac.kr/handle/201301/35377
Fulltext
http://ieeexplore.ieee.org/document/7758789/
Citation
41st International Conference on Infrared, Millimeter and Terahertz Waves, IRMMW-THz 2016
Abstract
The Quasi-Optical Photoconductivity Decay (QO-PCD) technique is developed by UNIST for precise measurement of minority carrier life time. This technique is suggested to an alternative method for a measurement technique of minority carrier lifetime using millimeter & THz waves. This paper presents a comparison of 2D mapping results between micro-PCD technique and QO-PCD technique. From the measurement result, QO-PCD technique can be an excellent alternative method for measuring minority carrier life time of semiconductors.
Publisher
41st International Conference on Infrared, Millimeter and Terahertz Waves, IRMMW-THz 2016
ISSN
2162-2027

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