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- Jeong, Hongsik
- Future Semiconductor Technology Lab.
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Dislocations in phase-change Ge2Sb2Te5 alloy
- Author(s)
- Zhang, W., Song, S.A., Jeong, H.S., Kim, J.G., Kim, Y.-J.
- Issued Date
- 2007-11-05
- Citation
- PRICM 6: The 6th Pacific Rim International Conference on Advanced Materials and Processing, pp.1097 - 1100
- Abstract
- Characteristic 60° dislocations occurred in hexagonal phase of Ge 2Sb2Te5 thin foil cooled from 500°C to room temperature in a high voltage transmission electron microscope. The Burgers vector of dislocation was identified as 1/24 〈9̄902〉 which is the edge component of 1/3 〈2̄110〉 projected on the (112̄0) lattice plane. The dislocation resulted from the cooling-induced stress/strain in the Ge2Sb2Te5 alloy.
- Publisher
- Trans Tech Publications
- ISSN
- 1022-6680
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