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심교승

Sim, Kyoseung
Organic Soft Electronics and System Lab.
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dc.citation.number 6 -
dc.citation.title JOURNAL OF MICROMECHANICS AND MICROENGINEERING -
dc.citation.volume 27 -
dc.contributor.author Sim, Kyoseung -
dc.contributor.author Wang, Xu -
dc.contributor.author Li, Yuhang -
dc.contributor.author Linghu, Changhong -
dc.contributor.author Gao, Yang -
dc.contributor.author Song, Jizhou -
dc.contributor.author Yu, Cunjiang -
dc.date.accessioned 2023-12-21T22:13:19Z -
dc.date.available 2023-12-21T22:13:19Z -
dc.date.created 2020-03-17 -
dc.date.issued 2017-05 -
dc.description.abstract The considerable need to enhance data and hardware security suggest one possible future for electronics where it is possible to destroy them and even make them disappear physically. This paper reports a type of destructive electronics which features fast transience from chemical dissolution on-demand triggered in an electrochemical-mechanical manner. The detailed materials, mechanics, and device construction of the destructive electronics are presented. Experiment and analysis of the triggered releasing and transience study of electronic materials, resistors and metal-oxide-semiconductor field effect transistors illustrate the key aspects of the destructive electronics. The reported destructive electronics is useful in a wide range of areas from security and defense, to medical applications -
dc.identifier.bibliographicCitation JOURNAL OF MICROMECHANICS AND MICROENGINEERING, v.27, no.6 -
dc.identifier.doi 10.1088/1361-6439/aa682f -
dc.identifier.issn 0960-1317 -
dc.identifier.scopusid 2-s2.0-85019499673 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/31592 -
dc.identifier.url https://iopscience.iop.org/article/10.1088/1361-6439/aa682f/meta -
dc.identifier.wosid 000400985700003 -
dc.language 영어 -
dc.publisher IOP PUBLISHING LTD -
dc.title Destructive electronics from electrochemical-mechanically triggered chemical dissolution -
dc.type Article -
dc.description.isOpenAccess FALSE -
dc.relation.journalWebOfScienceCategory Engineering, Electrical & Electronic; Nanoscience & Nanotechnology; Instruments & Instrumentation; Physics, Applied -
dc.relation.journalResearchArea Engineering; Science & Technology - Other Topics; Instruments & Instrumentation; Physics -
dc.type.docType Article -
dc.description.journalRegisteredClass scie -
dc.description.journalRegisteredClass scopus -
dc.subject.keywordAuthor destructive electronics -
dc.subject.keywordAuthor transient electronics -
dc.subject.keywordAuthor electrochemical-mechanical -
dc.subject.keywordAuthor dissolution -
dc.subject.keywordPlus SILICON NANOMEMBRANES -
dc.subject.keywordPlus TRANSIENT -

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