Electrical properties, thermodynamic behavior, and defect analysis of Lan+1NinO3n+1+delta infiltrated into YSZ scaffolds as cathodes for intermediate-temperature SOFCs

Yoo, Seonyoung; Choi, Sihyuk; Shin, Jeeyoung; Liu, Meilin; Kim, Guntae

doi:10.1039/c2ra20402a

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Electrical properties, thermodynamic behavior, and defect analysis of Lan+1NinO3n+1+delta infiltrated into YSZ scaffolds as cathodes for intermediate-temperature SOFCs

Author(s): Yoo, Seonyoung, Choi, Sihyuk, Shin, Jeeyoung, Liu, Meilin, Kim, Guntae

Issued Date: 2012-06

DOI: 10.1039/c2ra20402a

URI: https://scholarworks.unist.ac.kr/handle/201301/2822

Fulltext: http://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=84861372895

Citation: RSC ADVANCES, v.2, no.11, pp.4648 - 4655

Publisher: ROYAL SOC CHEMISTRY

ISSN: 2046-2069

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