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Effects of aluminum doping on the structural and optical properties of ZnO nanorods grown on highly conductive films

Author(s)
Ma, Hyunggun
Issued Date
2019-07
DOI
10.1007/s10854-019-01613-5
URI
https://scholarworks.unist.ac.kr/handle/201301/27233
Fulltext
https://link.springer.com/article/10.1007%2Fs10854-019-01613-5
Citation
JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, v.30, no.13, pp.12532 - 12539
Abstract
ZnO nanorods were grown on similar to 50-nm-thick transparent conductive oxide thin films by hydrothermal synthesis. The resistivity of the ZnO films was lowered to 4x10(-4) Omega cm upon Ga doping. Zinc nitrate hexahydrate, mixed with hexamethylenetetramine, was dissolved in deionized water to prepare a synthesis solution. Aluminum nitrate nonahydrate was added to the synthesis solution to dope the Al into ZnO nanorods. X-ray diffraction analysis and field-emission scanning electron microscopy were conducted to study the crystal structure and morphology of the nanorods, respectively. Al doping enhanced the preferential orientation to (002) of a wurtzite structure and increased the compressive strain. The trace of Al in the ZnO nanorods was detected by energy dispersive X-ray spectroscopy. The optical properties were investigated by measuring the transmittance, Raman shift, and photoluminescence. Al doping led to a blue shift or red shift in the energy band gap. The results of the Raman shift confirmed the compressive stress in the ZnO nanorods. Sharp ultraviolet (UV) and broad visible photoluminescence peaks were obtained irrespective of Al concentration in the ZnO nanorods. The intensity of the UV peak doubled by Al doping.
Publisher
SPRINGER
ISSN
0957-4522
Keyword
BAND-EDGE EMISSIONNANOSTRUCTURESTEMPERATUREMORPHOLOGYSTRESS

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