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권오훈

Kwon, Oh Hoon
Ultrafast Laser Spectroscopy and Nano-microscopy Lab.
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Ultrafast Electron Energy-Loss Spectroscopy in Transmission Electron Microscopy

Author(s)
Pomarico, EnricoKim, Ye-Jinde Abajo, F. Javier GarcíaKwon, Oh-HoonCarbone, Fabriziovan der Veen, Renske M
Issued Date
2018-07
DOI
10.1557/mrs.2018.148
URI
https://scholarworks.unist.ac.kr/handle/201301/23957
Fulltext
https://www.cambridge.org/core/journals/mrs-bulletin/article/ultrafast-electron-energyloss-spectroscopy-in-transmission-electron-microscopy/A9851753ACD0CAB017323FCE08EEE3CF
Citation
MRS BULLETIN, v.43, no.7, pp.497 - 503
Abstract
In the quest for dynamic multimodal probing of a material’s structure and functionality, it is critical to be able to quantify the chemical state on the atomic-/nanoscale using element-specific electronic and structurally sensitive tools such as electron energy-loss spectroscopy (EELS). Ultrafast EELS, with combined energy, time, and spatial resolution in a transmission electron microscope, has recently enabled transformative studies of photoexcited nanostructure evolution and mapping of evanescent electromagnetic fields. This article aims to describe state-of-the-art experimental techniques in this emerging field and its major uses and future applications.
Publisher
CAMBRIDGE UNIV PRESS
ISSN
0883-7694
Keyword (Author)
electron energy-loss spectroscopy (EELS)laser-induced reactionnanoscaleelectronic structureoptical properties
Keyword
NEAR-FIELDIN-SITUDIFFRACTIONDYNAMICSRESOLUTIONSURFACEMODE

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