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Structural and Magnetic Properties of Tetragonal Mn1.19Fe0.81As Thin Film Grown on Si(001)
- Author(s)
- Hwang, Younghun, Choi, Jeongyong, Han, Suk-Hee, Choi, Sungyoul, Kim, Yong-Hamb, Lee, Min-Kyu, Cho, Sunglae
- Issued Date
- 2008-02
- Citation
- JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.52, pp.S96 - S99
- Abstract
- We have successfully grown MnxFe2-xAs (x = 1.19) thin film on Si(001) substrate by molecular beam epitaxy. Reflection high-energy electron diffraction (RHEED) and X-ray diffraction (XRD) studies indicate the rough film surface and c-axis orientation in a tetragonal crystal structure. Mn1.19Fe0.81As film exhibited ferrimagnetic ordering at room temperature, which is supported by magnetization, magnetoresistance and anomalous-Hall-effect measurements.
- Publisher
- KOREAN PHYSICAL SOC
- ISSN
- 0374-4884
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