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장지원

Chang, Jiwon
Exploratory Device Research Lab.
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dc.citation.number 23 -
dc.citation.startPage 235108 -
dc.citation.title PHYSICAL REVIEW B -
dc.citation.volume 83 -
dc.contributor.author Chang, Jiwon -
dc.contributor.author Register, Leonard F. -
dc.contributor.author Banerjee, Sanjay K. -
dc.contributor.author Sahu, Bhagawan -
dc.date.accessioned 2023-12-22T06:08:35Z -
dc.date.available 2023-12-22T06:08:35Z -
dc.date.created 2017-02-08 -
dc.date.issued 2011-06 -
dc.description.abstract Using an ab initio density functional theory based electronic structure method with a semilocal density approximation, we study thin-film electronic properties of two topological insulators based on ternary compounds of Tl (thallium) and Bi (bismuth). We consider TlBiX2 (X = Se, Te) and Bi2X2Y (X, Y = Se, Te) compounds which provide better Dirac cones, compared to the model binary compounds Bi2X3(X = Se, Te). With this property in combination with a structurally perfect bulk crystal, the latter ternary compound has been found to have improved surface electronic transport in recent experiments. In this article, we discuss the nature of surface states, their locations in the Brillouin zone and their interactions within the bulk region. Our calculations suggest a critical thin film thickness to maintain the Dirac cone which is significantly smaller than that in binary Bi-based compounds. Atomic relaxations or rearrangements are found to affect the Dirac cone in some of these compounds. And with the help of layer-projected surface charge densities, we discuss the penetration depth of the surface states into the bulk region. The electronic spectrum of these ternary compounds agrees very well with the available experimental results. -
dc.identifier.bibliographicCitation PHYSICAL REVIEW B, v.83, no.23, pp.235108 -
dc.identifier.doi 10.1103/PhysRevB.83.235108 -
dc.identifier.issn 2469-9950 -
dc.identifier.scopusid 2-s2.0-79961194972 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/21327 -
dc.identifier.url http://journals.aps.org/prb/abstract/10.1103/PhysRevB.83.235108 -
dc.identifier.wosid 000291310800005 -
dc.language 영어 -
dc.publisher AMER PHYSICAL SOC -
dc.title Density functional study of ternary topological insulator thin films -
dc.type Article -
dc.description.isOpenAccess FALSE -
dc.relation.journalWebOfScienceCategory Materials Science, Multidisciplinary; Physics, Applied; Physics, Condensed Matter -
dc.relation.journalResearchArea Materials Science; Physics -
dc.description.journalRegisteredClass scie -
dc.description.journalRegisteredClass scopus -
dc.subject.keywordPlus TOTAL-ENERGY CALCULATIONS -
dc.subject.keywordPlus AUGMENTED-WAVE METHOD -
dc.subject.keywordPlus SINGLE DIRAC CONE -
dc.subject.keywordPlus BASIS-SET -
dc.subject.keywordPlus SURFACE -
dc.subject.keywordPlus BI2TE3 -
dc.subject.keywordPlus CHALCOGENIDES -
dc.subject.keywordPlus BI2SE3 -

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