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Jeong, Hu Young
UNIST Central Research Facilities (UCRF)
Research Interests
  • Soft material characterization such as graphene using a low kV Cs-corrected TEM
  • Insitu-TEM characterization of carbon-based materials using nanofactory STM holder for Li-ion battery application
  • Structural characterization of mesoporous materials using SEM & TEM
  • Interface analysis between various oxides and metals through Cs-corrected (S)TEM
  • Resistive switching mechanism of graphene oxide thin films for RRAM application

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Wafer-Scale Single-Crystalline AB-Stacked Bilayer Graphene

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Title
Wafer-Scale Single-Crystalline AB-Stacked Bilayer Graphene
Author
Nguyen. Van LuanPerello, David J.Lee, SeunghunNai, Chang TaiShin, Bong GyuKim. Joong-GyuPark, Ho YeolJeong, Hu YoungZhao, JiongVu, Quoc AnLee, Sang HyubLoh, Kian PingJeong, Se-YoungLee, Young Hee
Issue Date
2016-10
Publisher
WILEY-V C H VERLAG GMBH
Citation
ADVANCED MATERIALS, v.28, no.37, pp.8177 - 8183
Abstract
Single-crystalline artificial AB-stacked bilayer graphene is formed by aligned transfer of two single-crystalline monolayers on a wafer-scale. The obtained bilayer has a well-defined interface and is electronically equivalent to exfoliated or direct-grown AB-stacked bilayers.
URI
https://scholarworks.unist.ac.kr/handle/201301/20652
URL
http://onlinelibrary.wiley.com/doi/10.1002/adma.201601760/abstract
DOI
10.1002/adma.201601760
ISSN
0935-9648
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UCRF_Journal Papers
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