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Lee, Zonghoon
Atomic-Scale Electron Microscopy (ASEM) Lab
Research Interests
  • Advanced Transmission Electron Microscopy (TEM/STEM), in Situ TEM, graphene, 2D materials, low-dimensional crystals, nanostructured materials

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Hole defects on 2D materials formed by electron beam irradiation: toward nanopore devices

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Title
Hole defects on 2D materials formed by electron beam irradiation: toward nanopore devices
Author
Park, Hyo JuRyu, Gyeng HeeLee, Zonghoon
Issue Date
2015-09
Publisher
Korean Society of Microscopy
Citation
APPLIED MICROSCOPY, v.45, no.3, pp.107 - 114
Abstract
Two-dimensional (2D) materials containing hole defects are a promising substitute for conventional nanopore membranes like silicon nitride. Hole defects on 2D materials, as atomically thin nanopores, have been used in nanopore devices, such as DNA sensor, gas sensor and purifier at lab-scale. For practical applications of 2D materials to nanopore devices, researches on characteristics of hole defects on graphene, hexagonal boron nitride and molybdenum disulfide have been conducted precisely using transmission electron microscope. Here, we summarized formation, features, structural preference and stability of hole defects on 2D materials with atomic-resolution transmission electron microscope images and theoretical calculations, emphasizing the future challenges in controlling the edge structures and stabilization of hole defects. Exploring the properties at the local structure of hole defects through in situ experiments is also the important issue for the fabrication of realistic 2D nanopore devices.
URI
https://scholarworks.unist.ac.kr/handle/201301/18154
URL
http://www.appmicro.org/journal/view.html?doi=10.9729/AM.2015.45.3.107
DOI
10.9729/AM.2015.45.3.107
ISSN
2287-5123
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MSE_Journal Papers
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