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Pak, Hyuk Kyu
Soft Condensed Matter Physics Lab (SCMP)
Research Interests
  • Soft matter, liquids, fluctuations, interfacial energy, energy harvesting, optical tweezers

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Investigation of surface charge density on solid-liquid interfaces by modulating the electrical double layer

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Title
Investigation of surface charge density on solid-liquid interfaces by modulating the electrical double layer
Author
Pak, Hyuk KyuMoon, Jong KyunSong, Myung Won
Issue Date
2015-05
Publisher
IOP PUBLISHING LTD
Citation
JOURNAL OF PHYSICS-CONDENSED MATTER, v.27, pp.194102
Abstract
A solid surface in contact with water or aqueous solution usually carries specific electric charges. These surface charges attract counter ions from the liquid side. Since the geometry of opposite charge distribution parallel to the solid-liquid interface is similar to that of a capacitor, it is called an electrical double layer capacitor (EDLC). Therefore, there is an electrical potential difference across an EDLC in equilibrium. When a liquid bridge is formed between two conducting plates, the system behaves as two serially connected EDLCs. In this work, we propose a new method for investigating the surface charge density on solid-liquid interfaces. By mechanically modulating the electrical double layers and simultaneously applying a dc bias voltage across the plates, an ac electric current can be generated. By measuring the voltage drop across a load resistor as a function of bias voltage, we can study the surface charge density on solid-liquid interfaces. Our experimental results agree very well with the simple equivalent electrical circuit model proposed here. Furthermore, using this method, one can determine the polarity of the adsorbed state on the solid surface depending on the material used. We expect this method to aid in the study of electrical phenomena on solid-liquid interfaces. © 2015 IOP Publishing Ltd.
URI
https://scholarworks.unist.ac.kr/handle/201301/13058
URL
http://iopscience.iop.org/0953-8984/27/19/194102/
DOI
10.1088/0953-8984/27/19/194102
ISSN
0953-8984
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PHY_Journal Papers
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