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Kwon, Daeil
IoT-based System Reliability Lab
Research Interests
  • Reliability, Prognostics and Health Management, Non-destructive Test

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Optimal Interval Censoring Design for Reliability Prediction of Electronic Packages

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Title
Optimal Interval Censoring Design for Reliability Prediction of Electronic Packages
Other Titles
전자패키지 신뢰성 예측을 위한 최적 구간중도절단 시험 설계
Author
Kwon, DaeilShin, Insun
Issue Date
2015-06
Publisher
한국마이크로전자및패키징학회
Citation
마이크로전자 및 패키징학회지, v.22, no.2, pp.1 - 4
Abstract
Qualification includes all activities to demonstrate that a product meets and exceeds the reliability goals. Manufacturers need to spend time and resources for the qualification processes under the pressure of reducing time to market, as well as offering a competitive price. Failure to qualify a product could result in economic loss such as warranty and recall claims and the manufacturer could lose the reputation in the market. In order to provide valid and reliable qualification results, manufacturers are required to make extra effort based on the operational and environmental characteristics of the product. This paper discusses optimal interval censoring design for reliability prediction of electronic packages under limited time and resources. This design should provide more accurate assessment of package capability and thus deliver better reliability prediction.
URI
https://scholarworks.unist.ac.kr/handle/201301/12772
URL
http://ocean.kisti.re.kr/IS_mvpopo001P.do?method=multMain&cn1=JAKO201523047607164&poid=ishm&free=
DOI
10.6117/kmeps.2015.22.2.001
ISSN
1226-9360
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