Optimal Interval Censoring Design for Reliability Prediction of Electronic Packages
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- Optimal Interval Censoring Design for Reliability Prediction of Electronic Packages
- Other Titles
- 전자패키지 신뢰성 예측을 위한 최적 구간중도절단 시험 설계
- Kwon, Daeil; Shin, Insun
- Issue Date
- 마이크로전자 및 패키징학회지, v.22, no.2, pp.1 - 4
- Qualification includes all activities to demonstrate that a product meets and exceeds the reliability goals. Manufacturers need to spend time and resources for the qualification processes under the pressure of reducing time to market, as well as offering a competitive price. Failure to qualify a product could result in economic loss such as warranty and recall claims and the manufacturer could lose the reputation in the market. In order to provide valid and reliable qualification results, manufacturers are required to make extra effort based on the operational and environmental characteristics of the product. This paper discusses optimal interval censoring design for reliability prediction of electronic packages under limited time and resources. This design should provide more accurate assessment of package capability and thus deliver better reliability prediction.
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