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Lee, Jae Sung
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Linear combination of XANES for quantitative analysis of Ti-Si binary oxides

Alternative Title
Linear combination of XANES for quantitative analysis of Ti-Si binary oxides
Author(s)
Lee, Jae SungKim, Won BaeChoi, Sun Hee
Issued Date
2001-03
DOI
10.1107/S0909049500020331
URI
https://scholarworks.unist.ac.kr/handle/201301/12679
Fulltext
http://scripts.iucr.org/cgi-bin/paper?S0909049500020331
Citation
JOURNAL OF SYNCHROTRON RADIATION, v.8, pp.163 - 167
Abstract
A new method is demonstrated for the quantification of Ti-O-Si and Ti-O-Ti bonds in Ti-Si binary oxides. It is based on the linear combination of two reference X-ray absorption near-edge structure (XANES) spectra at the Ti K edge. The proper selection of a Ti-O-Si reference material is most important for the successful application of this method. Three Ti-Si binary oxide systems have been analysed by the new method: Ti-Si mixed oxides, titania supported on silica and Ti-substituted MCM-41 (crystalline mesoporous molecular sieve material invented by Mobil) with various Ti contents
Publisher
WILEY-BLACKWELL
ISSN
0909-0495

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