dc.citation.endPage |
167 |
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dc.citation.startPage |
163 |
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dc.citation.title |
JOURNAL OF SYNCHROTRON RADIATION |
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dc.citation.volume |
8 |
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dc.contributor.author |
Lee, Jae Sung |
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dc.contributor.author |
Kim, Won Bae |
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dc.contributor.author |
Choi, Sun Hee |
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dc.date.accessioned |
2023-12-22T11:45:21Z |
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dc.date.available |
2023-12-22T11:45:21Z |
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dc.date.created |
2015-07-27 |
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dc.date.issued |
2001-03 |
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dc.description.abstract |
A new method is demonstrated for the quantification of Ti-O-Si and Ti-O-Ti bonds in Ti-Si binary oxides. It is based on the linear combination of two reference X-ray absorption near-edge structure (XANES) spectra at the Ti K edge. The proper selection of a Ti-O-Si reference material is most important for the successful application of this method. Three Ti-Si binary oxide systems have been analysed by the new method: Ti-Si mixed oxides, titania supported on silica and Ti-substituted MCM-41 (crystalline mesoporous molecular sieve material invented by Mobil) with various Ti contents |
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dc.identifier.bibliographicCitation |
JOURNAL OF SYNCHROTRON RADIATION, v.8, pp.163 - 167 |
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dc.identifier.doi |
10.1107/S0909049500020331 |
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dc.identifier.issn |
0909-0495 |
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dc.identifier.scopusid |
2-s2.0-0035288895 |
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dc.identifier.uri |
https://scholarworks.unist.ac.kr/handle/201301/12679 |
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dc.identifier.url |
http://scripts.iucr.org/cgi-bin/paper?S0909049500020331 |
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dc.identifier.wosid |
000167298100025 |
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dc.language |
영어 |
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dc.publisher |
WILEY-BLACKWELL |
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dc.title.alternative |
Linear combination of XANES for quantitative analysis of Ti-Si binary oxides |
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dc.title |
Linear combination of XANES for quantitative analysis of Ti-Si binary oxides |
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dc.type |
Article |
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dc.description.journalRegisteredClass |
scopus |
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