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Polarized Raman confocal microscopy of single gallium nitride nanowires
- Alternative Title
- Polarized Raman confocal microscopy of single gallium nitride nanowires
- Author(s)
- Pauzauskie, Peter J., Talaga, David, Seo, Kwanyong, Yang, Peidong, Lagugne-Labarthet, Franc¸ois
- Issued Date
- 2005-12
- Citation
- JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, v.127, no.49, pp.17146 - 17147
- Abstract
- Polarized Raman spectra and corresponding Raman scattering intensity images of an isolated gallium nitride nanowire with a diameter of 170 nm are presented. The sensitivity of the confocal microscope combined with a high-resolution piezoelectric stage enables analysis of the crystalline phase and crystallographic orientation of an individual nanowire with an excellent spatial and spectral resolution in a short acquisition time. Copyright © 2005 American Chemical Society.
- Publisher
- AMER CHEMICAL SOC
- ISSN
- 0002-7863
- Keyword
- GAN, SCATTERING, SILICON
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