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Bitmap-assisted focused ion beam fabrication of combined atomic force scanning electrochemical Microscopy probes

Moon, Jong-Seok , Shin, Heungjoo , Mizaikoff, Boris , Kranz, Christine

Article Issue Date2007-09 View106
Design and measurement of nanopatterns for FIB reliability assessments File

Kang, Hyun-Wook , Cho, Dong-Woo

Article Issue Date2007-05 View118
Nanoscale Focus Pinspot for High-Purity Quantum Emitters via Focused-Ion-Beam-Induced Luminescence Quenching File

Choi, Minho , Jun, Seongmoon , Woo, Kie Young , Song, Hyun Gyu , Yeo, Hwan-Seop , Choi, Sunghan , Park, Doyoun , Park, Chung-Hyun , Cho, Yong-Hoon

Article Issue Date2021-07 View31
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