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Low Operating Voltage and Immediate Read-After-Write of HZO-Based Si Ferroelectric Field-Effect Transistors with High Endurance and Retention Characteristics File File

Kim, Bong Ho , Kuk, Song-Hyeon , Kim, Seong Kwang , Kim, Joon Pyo , Suh, Yoon-Je , Jeong, Jaeyong , Lee, Chan Jik , Geum, Dae-Myeong , Yoon, Young Joon , Kim, Sang Hyeon

Article Issue Date2024-01 View0
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