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Artifact-free sample preparation of metal thin films using Xe plasma-focused ion beam milling for atomic resolution and in situ biasing analyses File

Lee, Hee-Beom , Kim, Seon Je , Jung, Min-Hyoung , Kim, Young-Hoon , Kim, Su Jae , Gao, Hai-Feng , Van Leer, Brandon , Jeong, Se-Young , Jeong, Hu Young , Kim, Young-Min

Article Issue Date2024-10 View132
Graphene: Substrate preparation and introduction File

Pantelic, Radosav S. , Suk, Ji Won , Magnuson, Carl W. , Meyer, Jannik C. , Wachsmuth, Philipp , Kaiser, Ute , Ruoff, Rodney S. , Stahlberg, Henning

Article Issue Date2011-04 View90
Influence of interparticle interaction on the structural, optical and magnetic properties of NiO nanoparticles File

Arif, Mohd , Sanger, Amit , Shkir, Mohd. , Singh, Arun , Katiyar, R.S.

Article Issue Date2019-01 View80
Polarization reversal via a transient relaxor state in nonergodic relaxors near freezing temperature File File

Hong, Chang-Hyo , Guo, Hanzheng , Tan, Xiaoli , Daniels, John E. , Jo, Wook

Article Issue Date2019-12 View116
Synthesis of high-quality monolayer graphene by low-power plasma File

Hong, Hyo-Ki , Kim, Na Yeon , Yoon, Aram , Lee, Suk Woo , Park, Jungmin , Yoo, Jung-Woo , Lee, Zonghoon

Article Issue Date2019-01 View122
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