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Artifact-free sample preparation of metal thin films using Xe plasma-focused ion beam milling for atomic resolution and in situ biasing analyses File

Lee, Hee-Beom , Kim, Seon Je , Jung, Min-Hyoung , Kim, Young-Hoon , Kim, Su Jae , Gao, Hai-Feng , Van Leer, Brandon , Jeong, Se-Young , Jeong, Hu Young , Kim, Young-Min

Article Issue Date2024-10 View133
Atomic interface structure and electronic properties at nanoscale rotated crystal in Ga2O3 homoepitaxial film File

Ngo, Trong Si , Hong, Soon-Ku , Kim, Hyeon Woo , Cho, Sung Beom , Kim, Young Heon , Vuong, Nguyen Quoc , Jeong, Hu Young , Hayyak, Raouf , Iqbal, Taswar , Jeon, Dae-Woo , et al

Article Issue Date2025-09 View84
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