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Artifact-free sample preparation of metal thin films using Xe plasma-focused ion beam milling for atomic resolution and in situ biasing analyses File

Lee, Hee-Beom , Kim, Seon Je , Jung, Min-Hyoung , Kim, Young-Hoon , Kim, Su Jae , Gao, Hai-Feng , Van Leer, Brandon , Jeong, Se-Young , Jeong, Hu Young , Kim, Young-Min

Article Issue Date2024-10 View133
Wireless phototherapeutic contact lenses and glasses with red light-emitting diodes File

Park, Young-Geun , Cha, Eunkyung , An, Hyeon Seok , Lee, Kyoung-Pil , Song, Myoung Hoon , Kim, Hong Kyun , Park, Jang-Ung

Article Issue Date2020-05 View137
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