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Showing results 1 to 8 of 8

Analyzing the Contact-Doping Effect in In₂O₃ FETs: Unveiling the Mechanisms Behind the Threshold-Voltage Roll-Off in Oxide Semiconductor Transistors File

Lin, Jian-Yu , Niu, Chang , Lin, Zehao , Lee, Sumi , Kim, Taehyun , Lee, Jungho , Liu, Chang , Lu, Juanjuan , Wang, Haiyan , Alam, Muhammad Ashraful , et al

Article Issue Date2025-06 View140
Doped NiO: The mottness of a charge transfer insulator File

Wrobel, F. , Park, H. , Sohn, Chang Hee , Hsiao, H.-W. , Zuo, J.-M. , Shin, H. , Lee, H.N. , Ganesh, P. , Benali, A. , Kent, P.R.C. , et al

Article Issue Date2020-05 View71
Experimental Investigation of a Dual-Beam Traveling Wave Tube File

Choi, Hong Eun , Choi, Wonjin , Lee, Junyoung , Choi, EunMi

Article Issue Date2024-07 View134
High throughput scanning μLEED imaging of surface structural heterogeneity: Defective graphene on Cu(111) File

Lau, K.L.W. , Yu, K.M. , Luo, D. , Ruoff, Rodney S. , Altman, M.S.

Article Issue Date2019-05 View164
Improvement in performance of inverted polymer solar cells by interface engineering of ALD ZnS on ZnO electron buffer layer File

Zafar, Muhammad , Kim, BongSoo , Kim, Do-Heyoung

Article Issue Date2019-07 View77
Recovery Operation in HfZrOx-Based FeFETs With Interfacial Layer Scavenging File

Kim, Bong Ho , Kim, Seong Kwang , Kuk, Song-Hyeon , Jeong, Jaeyong , Park, Youngkeun , Suh, Yoon-Je , Kim, Joon Pyo , Lee, Chan Jik , Geum, Dae-Myeong , Cho, Byung Jin , et al

Article Issue Date2026-02 View0
Robust Disturb Immunity in AND-Type 1T FeFET Arrays by Electron Detrapping Mode File

Kim, Bong Ho , Kuk, Song-Hyeon , Hwang, Hyeon-Seong , Jeong, Jaeyong , Park, Youngkeun , Suh, Yoon-Je , Kim, Joon Pyo , Lee, Chan Jik , Cho, Byung Jin , Kim, Sang Hyeon

Article Issue Date2026-01 View0
Unified Model for Trap-Limited Conduction via Field-Driven Interactions and Poole-Frenkel Emission File

Ko, Kyungmin , Lim, Dong-Hyeok , Suh, Joonki

Article Issue Date2025-02 View88
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